會議論文- Tong-Yu Hsieh
| 出版年月 | 著作類別 | 著作名稱 | 作者 | 收錄出處 |
| 2023/9/1 | 研討會論文 | Cost-effective error-mitigation for high memory error rate of DNN: A case study on YOLOv4 | W.-J. Chao and T.-Y. Hsieh | |
| 2022/11/1 | 研討會論文 | On no-reference error detection of an image stitching system based on error-tolerance | T.-Y. Hsieh, P.-W. Tsui and J.-T. Wu | |
| 2021/9/1 | 研討會論文 | Investigation on error-tolerability enhancement of videos via re-encoding for computer vision: a case study on object detection | T.-Y. Hsieh and J.-T. Wu | |
| 2021/6/1 | 研討會論文 | Concurrent test of reconfigurable scan networks for self-aware systems | C.-H. Wang, N. Lylina, A. Atteya, T.-Y. Hsieh, H.-J. Wunderlich | |
| 2020/9/1 | 研討會論文 | A Self-Detection and Self-Repair Methodology for Reliable Speech Recognition Considering AWGN Noises | T.-Y. Hsieh and Y.-M. Chung | |
| 2020/9/1 | 研討會論文 | On Enhancing Error-Tolerability of Videos via Re-Encoding with Adaptive I-Frame Insertion | T.-Y. Hsieh, C.-C. Chung and J.-T. Wu | |
| 2020/8/1 | 研討會論文 | A cost-effective reliable edge computing hardware design based on module simplification and duplication: a case study on vehicle detection based on support vector machine | T.-Y. Hsieh, H.-Y. Shen and C.-T. Hsu | |
| 2020/4/1 | 研討會論文 | On classification of acceptable images for reliable artificial intelligence systems: a case study on pedestrian detection | T.-Y. Hsieh, P.-X. Wu and C.-C. Cheng | |
| 2019/9/1 | 研討會論文 | A delay-aware implementation scheme for cost-effective implication-based concurrent error detection | T.-Y. Hsieh, K.-C. Lin and H.-H. Lin | |
| 2019/3/1 | 研討會論文 | On automatic generation of training images for machine learning in automotive applications | T.-Y. Hsieh, Y.-C. Lin and H.-Y. Shen | |
| 2018/8/1 | 研討會論文 | A no-reference error-tolerability test methodology for image processing applications | T.-Y. Hsieh and C.-R. Chen | |
| 2018/8/1 | 研討會論文 | Error indication signal collapsing for implication-based concurrent error detection | C.-H. Wang, C.-H. Ho and T.-Y. Hsieh | |
| 2018/5/1 | 研討會論文 | On no-reference on-line error-tolerability testing for videos | T.-Y. Hsieh, S.-E. Chan and C.-H. Ho | |
| 2017/11/1 | 研討會論文 | Error-tolerability evaluation and test for images in face detection applications | T.-Y. Hsieh, T.-A. Cheng and C.-R. Chen | |
| 2017/9/1 | 研討會論文 | A hybrid concurrent error detection scheme for simultaneous improvement on probability of detection and diagnosability | C.-H. Wang and T.-Y. Hsieh | |
| 2017/5/1 | 研討會論文 | Approximate functional testing for image applications based on error-tolerance | T.-Y. Hsieh, T.-A. Cheng and C.-R. Chen | |
| 2017/5/1 | 研討會論文 | On repair of erroneous images for faulty circuits | T.-Y. Hsieh and T.-A. Cheng | |
| 2016/5/1 | 研討會論文 | A design-Independent on-line system dependability enhancement framework based on error-tolerance | T.-Y. Hsieh and Y.-H. Peng | |
| 2015/7/1 | 研討會論文 | Filtering-based error-tolerability evaluation of image processing circuits | T.-Y. Hsieh and Y.-H. Peng | |
| 2014/5/1 | 研討會論文 | Output-bit selection with x-avoidance using multiple counters for test-response compaction | W.-C. Lien, K.-J. Lee, K. Chakrabarty and T.-Y. Hsieh | |
| 2014/4/1 | 研討會論文 | On efficient error-tolerability evaluation and maximization for image processing applications | T.-Y. Hsieh, K.-H. Li and Y.-H. Peng | |
| 2014/4/1 | 研討會論文 | Output selection for test response compaction based on multiple counters | W.-C. Lien, K.-J. Lee, K. Chakrabarty and T.-Y. Hsieh, | |
| 2013/11/1 | 研討會論文 | A new LFSR reseeding scheme via internal response feedback | W.-C. Lien, K.-J. Lee, T.-Y. Hsieh, K. Chakrabarty | |
| 2013/11/1 | 研討會論文 | An efficient test methodology for image processing applications based on error-tolerance | T.-Y. Hsieh, Y.-H. Peng and C.-C. Ku | |
| 2013/8/1 | 研討會論文 | An internal-response-based LFSR reseeding technique | W.-C. Lien, K.-J. Lee and T.-Y. Hsieh, S.-M. Li and K. Chakrabarty | |
| 2013/8/1 | 研討會論文 | Efficient acceptability evaluation for image processing applications based on error-tolerance | T.-Y. Hsieh, Y.-H. Peng and C.-C. Ku | |
| 2013/7/1 | 研討會論文 | A new selection algorithm to avoid unknown responses via counter-based output selection scheme | W.-C. Lien, K.-J. Lee and T.-Y. Hsieh, and K. Chakrabarty | |
| 2013/7/1 | 研討會論文 | Cost-effective reliability improvement of branch direction predictors based on performance degradation tolerance | S.-Y. Huang and T.-Y. Hsieh | |
| 2012/12/1 | 研討會論文 | A yield and reliability enhancement framework for image processing applications | T.-Y. Hsieh, C.-C. Ku and C.-H. Yeh | |
| 2012/11/1 | 研討會論文 | A test-per-clock LFSR reseeding algorithm for concurrent reduction on test sequence length and test data volume | W.-C. Lien, K.-J. Lee and T.-Y. Hsieh | |
| 2012/10/1 | 研討會論文 | Output bit selection for test response compaction based on a single counter | W.-C Lien, K,-J. Lee and T.-Y. Hsieh | |
| 2012/8/1 | 研討會論文 | High-performance deterministic BIST using multiple twisted-ring counters | W.-C. Lien, W.-L. Ang, T.-Y. Hsieh and K.-J. Lee | |
| 2012/7/1 | 研討會論文 | Test response compaction based on a single counter | W.-C. Lien, K.-J. Lee, T.-Y. Hsieh, K. Chakrabarty and Y.-H. Wu | |
| 2012/5/1 | 研討會論文 | Accumulator-based output selection for test response compaction | W.-C. Lien, K.-J. Lee, T.-Y. Hsieh, S.-S. Chien and K. Chakrabarty | |
| 2012/4/1 | 研討會論文 | Routing-efficient implementation of an internal-response-based BIST architecture | W.-C. Lien, T.-Y. Hsieh and K.-J. Lee | |
| 2011/8/1 | 研討會論文 | Test response compaction via accumulator-based output selection | W.-C. Lien, K.-J. Lee, T.-Y. Hsieh and S.-S. Chien | |
| 2011/7/1 | 研討會論文 | Concurrent determination of seeds and test sequences for LFSR reseeding | W.-C. Lien, K.-J. Lee and T.-Y. Hsieh | |
| 2011/4/1 | 研討會論文 | A rotation-based BIST with self-feedback logic to achieve complete fault coverage | W.-C. Lien, T.-Y. Hsieh, C.-T. Tsai and K.-J. Lee | |
| 2009/11/1 | 研討會論文 | Tolerance of performance degrading faults for effective yield improvement | T.-Y. Hsieh, M. A. Breuer, M. Annavaram, S. K. Gupta and K.-J. Lee | |
| 2007/10/1 | 研討會論文 | Test efficiency analysis and improvement of SOC test platforms | T.-Y. Hsieh, K.-J. Lee and J.-J. You | |
| 2007/4/1 | 研討會論文 | Reduction of Detected Acceptable Faults for Yield Improvement via Error-Tolerance | Tong-Yu Hsieh, Kuen-Jong Lee* and Melvin A. Breuer | |
| 2006/5/1 | 研討會論文 | An Error-Oriented Test Methodology to Improve Yield with Error-Tolerance | Tong-Yu Hsieh, Kuen-Jong Lee* and Melvin A. Breuer | |
| 2005/11/1 | 研討會論文 | A Novel Test Methodology Based on Error-Rate to Support Error-Tolerance | Kuen-Jong Lee*, Tong-Yu Hsieh and Melvin A. Breuer |
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