會議論文- Cheng-Yu Ma
出版年月 | 著作類別 | 著作名稱 | 作者 |
Dec-23 | 研討會論文 | First Demonstration of Defect Elimination for Cryogenic Ge FinFET CMOS Inverter Showing Steep Subthreshold Slope by Using Ge-on-Insulator Structure | X.-R. Yu, C.-C. Hsieh, M.-H. Chuang, M.-Y. Chiu, T.-C. Sun, W.-Z. Geng, W.-H. Chang, Y.-J. Shih, W.-H. Lu, W.-C. Chang, Y.-C. Lin, Y.-C. Pai, C.-Y. Lai, M.-H. Chuang, Y. Dei, C.-Y. Yang, H.-Y. Lu, N.-C. Lin, C.-T. Wu, K.-H. Kao, W. C.-Y. Ma, D. D. Lu, Y.-J. Lee, G.-L. Luo, M.-H. Chiang, T. Maeda, W.-F. Wu, Y.-M. Li, and T.-H. Hou |
Oct-23 | 研討會論文 | Assessing the Gate-Bias Stress Instability of Double-Gate versus Single-Gate Operations in Polycrystalline-Silicon Nanosheet Transistors | William Cheng-Yu Ma, Jing-Qiang Guo, Cheng-Jun Wu, Po-Ying Wu, Jia-Yuan Hung, Yen-Chen Chen, Yi-Han Li, Ji-Min Yang, Yu-Chieh Yen |
Oct-23 | 研討會論文 | Exploring the Trade-off Between Performance Enhancement and Reliability Degradation in Nanosheet-structured Polycrystalline-silicon Thin Film Transistors | William Cheng-Yu Ma, Jing-Qiang Guo, Cheng-Jun Wu, Po-Ying Wu, Jia-Yuan Hung, Yen-Chen Chen, Yi-Han Li, Ji-Min Yang, Yu-Chieh Yen |
Sep-23 | 研討會論文 | Investigation of Top-gate MoS2 FETs by Low-temperature ALD High-κ and Hydrazine Passivated Interface | Min-Kun Huang, Hsu-Tang Liao, William Cheng-Yu Ma, Yeong-Her Wang, and Chun-Jung Su |
Jul-23 | 研討會論文 | Tunnel Thin-Film Transistor Featuring Ferroelectric Gate Stack for Synaptic Applications | William Cheng-Yu Ma, Chun-Jung Su, Kuo-Hsing Kao, Ta-Chun Cho, Jing-Qiang Guo, Cheng-Jun Wu, Po-Ying Wu, and Jia-Yuan Hung |
Dec-22 | 研討會論文 | Integration design and process of 3-D heterogeneous 6T SRAM with double layer transferred Ge/2Si CFET and IGZO pass gates for 42% reduced cell size | X.-R. Yu, M.-H. Chuang, S.-W. Chang, W.-H. Chang, T.-C. Hong, C.-H. Chiang, W.-H. Lu, C.-Y. Yang, W.-J. Chen, J.-H. Lin, P.-H. Wu, T.-C. Sun, S. Kola, Y.-S. Yang, Yun Da, P.-J. Sung, C.-T. Wu, T.-C. Cho, G.-L. Luo, K.-H. Kao, M.-H. Chiang, W. C.-Y. Ma, C.-J. Su, T.-S. Chao, T. Maeda, S. Samukawa, Y. Li, Y.-J. Lee, W.-F. Wu, J.-H. Tarng, and Y.-H. Wang |
Jun-22 | 研討會論文 | First demonstration of vertical stacked hetero-oriented n-Ge (111)/p-Ge (100) CFET toward mobility balance engineering | X.-R. Yu, W.-H Chang, T.-C. Hong, P.-J. Sung, A. Agarwal, G.-L. Luo, C.-T. Wu, K.-H. Kao, C.-J. Su, S.-W. Chang, W.-H. Lu, P.-Y. Fu, J.-H. Lin, P.-H. Wu, T.-C. Cho, W. C.-Yu. Ma, D.-D. Lu, T.-S. Chao, T. Maeda, Y.-J. Lee, W.-F. Wu, and W.-K. Yeh |
May-22 | 研討會論文 | Analysis of the performance and negative bias temperature instability in LTPS TFTs using low temperature process | Chia-Chuan Wu, William Cheng-Yu Ma, Yu-Xuan Wang, Mao-Chou Tai, Yu-An Chen, Pei-Jun Sun, Hong-Yi Tu, Kuan-Ju Zhou, Yu-Shan Shih, Sheng-Yao Chou, Ya-Ting Chien, Ting-Chang Chang |
May-22 | 研討會論文 | Antiferroelectricity and ferroelectricity of Si-doped HfOx thin films | J. C. Chang, C. L. Yen, M. K. Huang, Y. H. Wang, C. J. Su, and W. C. Y. Ma |
May-22 | 研討會論文 | Impacts of negative gate bias stress on ferroelectric thin-film transistor memory | William Cheng-Yu Ma, Chun-Jung Su, Yao-Jen Lee, Kuo-Hsing Kao, Jhe-Wei Jhu, Pin-Hua Wu, Ju-Heng Lin, Jui-Che Chang, Cheng-Lun Yen, Hsin-Chun Tseng, Hsu-Tang Liao, Yu-Wen Chou, Min-Yu Chiu, and Yan-Qing Chen |
May-22 | 研討會論文 | Investigation of HfN interlayers on ferroelectricity of HfZrO2 | C. L. Yen, J. C. Chang, M. K. Huang, Y. H. Wang, C. J. Su, and W. C. Y. Ma |
Dec-21 | 研討會論文 | First demonstration of heterogeneous IGZO/Si CFET monolithic 3D integration with dual workfunction gate for ultra low-power SRAM and RF applications | Y.-J. Lee, S.-W. Chang, T.-H. Lu, C.-Y. Yang, C.-J. Yeh, M.-K. Huang, C.-F. Meng, P.-J. Chen, T.-H. Chang, Y.-S. Chang, J.-W. Jhu, T.-Z. Hong, C.-C. Ke, X.-R. Yu, W.-H. Lu, M. A. Baig, P.-J. Sung, T.-C. Cho, C.-J. Su, F.-K. Hsueh, B.-Y. Chen, H.-H. Hu, C.-T. Wu, K.-L. Lin, W. C.-Y. Ma, D. D. Lu, K.-H. Kao, C.-L. Lin, K.-P. Huang, K.-M. Chen, Y. Li, S. Samukawa, T.-S. Chao, G.-W. Huang, W.-F. Wu, J.-M. Shieh, W.-H. Lee, J.-Y Li, J.-H. Tarng, Y.-H. Wang, and W.-K. Yeh |
Nov-21 | 研討會論文 | Demonstration of ferroelectric tunnel thin-film transistor with HfZrOx gate dielectric for application of synaptic device | Jui-Che Chang, Pin-Hua Wu, Cheng-Lun Yen, Ju-Heng Lin, Hsu-Tang Liao, Hsin-Chun Tseng, Min-Yu Chiu, Yan-Qing Chen, Yu-Wen Chou, William Cheng-Yu Ma |
Dec-20 | 研討會論文 | First demonstration of heterogeneous complementary FETs utilizing low-temperature (200 °C) hetero-layers bonding technique (LT-HBT) | Y.-J. Lee, T.-Z. Hong, W. -H. Chang, A. Agarwal, Y.-T. Huang, C.-Y. Yang, T.-Y. Chu, H.-Y. Chao, Y. Chuang, S.-T. Chung, J.-H. Lin, S.-M. Luo, C.-J. Tsai, M.-J. Li, X.-R. Yu, N.-C. Lin, T.-C. Cho, P.-J. Sung, C.-J. Su, G.-L. Luo, F.-K. Hsueh, H. Ishii, T. Irisawa, T. Maeda, K.-L. Lin, C.-T. Wu, W. C.-Yu. Ma, H. J.-H. Chen, C.-L. Lin, Darsen Lu, R. W. Chuang, K.-P. Huang, S. Samukawa, Y.-M. Li, J.-H. Tarng, T.-S. Chao, M. Miura, W.-F. Wu, G.-W. Huang, J.-Y. Li, J. M. Shieh, Y.-H. Wang, and W. K. Yeh |
Dec-19 | 研討會論文 | First demonstration of CMOS inverter and 6T-SRAM based on GAA CFETs structure for 3D-IC applications | S.-W. Chang, P.-J. Sung, T-Y. Chu, D. D. Lu, C. -J. Wang, N.-C. Lin, C.-J. Su, S.-H. Lo, H.-F. Huang, J.-H. Li, M.-K. Huang, Y.-C. Huang, S.-T. Huang, H.-C. Wang, Y.-J. Huang, J.-Y. Wang, L.-W Yu, Y.-F. Huang, F.-K. Hsueh, C.-T. Wu, W. C.-Y. Ma, K.-H. Kao, Y.-J. Lee, C.-L. Lin, R.W. Chuang, K.-P. Huang, S. Samukawa, Y. Li, W.-H. Lee, T.-S. Chao, G.-W. Huang, W.-F. Wu, J.-Y. Li, J.-M. Shieh, W. -K. Yeh, Y.-H. Wang |
Dec-19 | 研討會論文 | Impacts of O2 plasma on negative gate bias stress instability of tunnel thin-film transistor | William Cheng-Yu Ma, Po-Jen Chen, Yan-Shiuan Chang, Jhe-Wei Jhu, and Ting-Hsuan Chang |
Dec-19 | 研討會論文 | Impacts of ammonia gas plasma surface treatment on junctionless polycrystalline-silicon thin-film transistor | William Cheng-Yu Ma, Yan-Shiuan Chang, Po-Jen Chen, Jhe-Wei Jhu, and Ting-Hsuan Chang |
Feb-19 | 研討會論文 | PON body effect on junctionless thin-film transistor | William Cheng-Yu Ma, Hsiao-Chun Wang, Li-Wei Yu, Jia-Yi Wang, Yan-Jia Huang, Ming-Jhe Li, Shen-Ming Luo, Cai-Jia Tsai, and Jiun-Hung Lin |
Dec-18 | 研討會論文 | Voltage Transfer Characteristic Matching by Different Nanosheet Layer Numbers of Vertically Stacked Junctionless CMOS Inverter for SoP/3D-ICs applications | P.-J. Sung, C.-Y. Chang, L.-Y. Chen, K.-H. Kao, C.-J. Su, T.-H. Liao, C.-C. Fang, C.-J. Wang1, T.-C. Hong, C.-Y. Jao, H.-S. Hsu, S.-X. Luo, Y.-S. Wang, H.-F. Huang, J.-H. Li, Y.-C. Huang, F.-K. Hsueh, C.-T. Wu, Y.-M. Huang, F.-J. Hou, G.-L. Luo, Y.-C. Huang, Y.-L. Shen, W. C.-Y. Ma, K.-P. Huang, K.-L. Lin, S. Samukawa, Y. Li, G.-W Huang, Y.-J. Lee*, J.-Y. Li, W.-F. Wu, J.-M. Shieh, T.-S. Chao, W. -K. Yeh, Y.-H. Wang, |
May-18 | 研討會論文 | Impacts of Interface Trap State Density on the Tunnel Field-Effect Transistor | William Cheng-Yu Ma, Hsiao-Chun Wang, Yan-Jia Huang, Le-Wei Yu, and Jia-Yi Wang |
Jun-17 | 研討會論文 | Positive bias temperature instability of tunnel thin-film transistor for applications of system-on-panel and three-dimension integrated circuits | William Cheng‐Yu Ma, Hui‐Shun Hsu, Che‐Yu Jao, Chih‐Cheng Fang, and Tzu‐Han Liao |
Nov-16 | 研討會論文 | Characterization of poly-Si tunnel field-effect transistors with different source/drain structures | Ruei-Jen Wu and William Cheng-Yu Ma |
Dec-15 | 研討會論文 | Interface trap reduction impacts on tunnel field-effect transistor by oxygen plasma | William Cheng-Yu Ma, B.-S. Huang, Y.-S. Huang, and Z.-D. Wu |
Dec-15 | 研討會論文 | Temperature effect and reliability improvement of Thin-Film transistor by plasma treatment | William Cheng-Yu Ma, Y.-S. Huang, B.-S. Huang, and Z.-D. Wu |
Nov-15 | 研討會論文 | Bi-layer dielectric structure of IGZO thin-film transistor for gate stack and passivation layer application | William Cheng-Yu Ma, M.-C. Lee, and C.-Y. Huang |
Nov-15 | 研討會論文 | Performance improvement of poly-Si tunnel thin-film transistor by trap passivation | C.-Y. Huang, M.-C. Lee, Y.-H. Chen, and William Cheng-Yu Ma |
Mar-15 | 研討會論文 | Performance improvement of LTPS-TFTs with various plasma surface treatment | William Cheng-Yu Ma and C.-Y. Huang |
Nov-14 | 研討會論文 | BTI comparison of CMOS LTPS-TFTs with high-k gate dielectric | William Cheng-Yu Ma*, Y.-H. Chen |
Dec-13 | 研討會論文 | Surface Roughness Scattering Improvement of LTPS-TFTs by O2 Plasma Oxidation | William Cheng-Yu Ma* |
Dec-13 | 研討會論文 | Threshold Voltage Reduction and Mobility Improvement of LTPS-TFTs by N2 Plasma Nitridation | William Cheng-Yu Ma* |
Jun-11 | 研討會論文 | The lanthanum oxide capping layer induced flat-band roll-off behaviors in high-k/metal-gate NMOSFETs with 28nm CMOS technology | W.-H. Hung, Y.-K. Fang, William Cheng-Yu Ma, T.-F. Chen, T.-M. Cheng, F.-R. Juang |
Dec-08 | 研討會論文 | Fluorinated HfO2 gate dielectrics engineering for CMOS by pre- and post-CF4 plasma passivation | W.-C. Wu, C.-S. Lai, S.-C. Lee, Ming-Wen Ma, T.-S. Chao, J.-C. Wang, C.-W. Hsu, P.-C. Chou, J.-H. Chen, K.-H. Kao, W.-C. Lo, T.-Y. Lu, L.-L. Tay, and N. Rowell |
Dec-07 | 研討會論文 | Performance enhancement for strained HfO2 nMOSFET with contact etch stop Layer (CESL) under pulsed-IV measurement | W.-C. Wu, T.-S. Chao, T.-H. Chiu, J.-C. Wang, C.-S. Lai, Ming-Wen Ma, W.-C. Lo, and Y.-H. Ho |
Sep-07 | 研討會論文 | Current transportation mechanism of HfO2 gate dielectrics with silicon surface fluorine implantation (SSFI) in CMOS Application | W. C. Wu, C. S. Lai, T. M. Wang, J. C. Wang, Ming Wen Ma, and T. S. Chao |
Sep-07 | 研討會論文 | NBTI-stress induced grain-boundary degradation in low-temperature poly-Si thin-film transistors | C.-Y. Chen, Ming-Wen Ma, W.-C. Chen, H.-Y. Lin, K.-L. Yeh, S.-D. Wang, and T.-F. Lei |
Apr-07 | 研討會論文 | A highly reliable multi-level and 2-bit/cell operation of wrapped-select-gate (WSG) SONOS memory with optimized ONO thickness | W.-C. Wu, T.-S. Chao, W.-C. Peng, W.-L. Yang, J.-C. Wang, J.-H. Chen, Ming-Wen Ma, C.-S. Lai, T.-Y. Yang, T.-P. Chen, C.-H. Chen, C.-H. Lin, H.-H. Chen, and Joe Ko |
Mar-07 | 研討會論文 | Dynamic negative bias temperature instability in low-temperature poly-Si thin-film transistors | C.-Y. Chen, T.-Y. Wang, Ming-Wen Ma, W.-C. Chen, H.-Y. Lin, K.-L. Yeh, S.-D. Wang, and T.-F. Lei |
Mar-07 | 研討會論文 | Impacts of nitric acid oxidation on low-temperature polycrystalline silicon TFTs with high-k gate dielectric | T.-Y. Yang, Ming-Wen Ma, K.-H. Kao, C.-J. Su, T.-S. Chao, and T.-F. Lei |
Mar-07 | 研討會論文 | Mobility improvement of HfO2 LTPS-TFTs with nitrogen implantation | Ming-Wen Ma, T.-Y. Yang, K.-H. Kao, C.-J. Su, C.-Y. Chen, T.-S. Chao, and T.-F. Lei |
Jan-07 | 研討會論文 | Improvement on performance and reliability of TaN/HfO2 LTPS-TFTs with fluorine implantation | Ming-Wen Ma, T.-Y. Yang, K.-S. Kao, T.-S. Chao, and T.-F. Lei |
Nov-06 | 研討會論文 | High performance LTPS-TFTs with HfO2 gate dielectric and nitric acid pre-treatment | Ming-Wen Ma, T.-Y. Yang, K.-S. Kao, C.-J. Su, T.-S. Chao, and T.-F. Lei |
Nov-06 | 研討會論文 | Ultra-low temperature growth of aluminum silicate dielectric formed by nitric acid | Ming-Wen Ma, K.-S. Kao, T.-S. Chao, and T.-F. Lei |
May-06 | 研討會論文 | Impacts of high-k offset spacer on 65-nm node SOI devices | Ming-Wen Ma, T.-S. Chao, K.-H. Kao, J.-S. Huang, and T.-F. Lei |
May-06 | 研討會論文 | Novel FD SOI devices structure for low standby power applications | Ming-Wen Ma, T.-S. Chao, K.-H. Kao, J.-S. Huang, and T.-F. Lei |
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